2 3 Seven oxide thickness measurements of wafers are studied to assess quality in a...

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2 3 Seven oxide thickness measurements of wafers are studied to assess quality in a semiconductor manufacturing process The data in angstroms are 1264 1280 1301 1300 1292 1307 and 1275 Calculate the sample average and sam ple standard deviation Construct a dot diagram of the data wins 2 13 Calc Con 2 7

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